In our last issue, we warned of entrapped flux residues under PQFN (Power Quad Flat No-Lead) components. This month, we highlight our troubleshooting of this issue, and what the resulting ionic contamination levels were after we initiated design changes and localized steam recovery cleaning. The photo to the left shows the PQFN area after localized steam cleaning.

Foresite has recently moved the production of the C3 test cells from a facility in China to QMR Plastics in Minneapolis, MN. QMR Plastics is a premier medical mold making company that has worked with high reliability industries such as medical and electronics for the past 35 years. They recently exhibited the technology used in making the C3 test cell at the MD&DM trade show in Minneapolis.

Foresite's president, Terry Munson will be presenting a technical paper at the SMTA's Pan Pacific Microelectronics Symposium on the Big Island of Hawaii. The presentation, entitled Controlling Localized Contamination on Microelectronic Assemblies with the Change to Lead Free Manufacturing, will be the opening presentation to the conference on Tuesday January 17th at 9:00am.

Terry Munson is giving a special presenation at the Electronics Manufacturers Association (EMA) of Seattle. His presentation entitled Residue Analysis on Electronic Hardware Using Ion Chromatography will take place December 6th between 5:30 pm and 7:30 pm. All Seattle industry associates are encouraged to attend this special engagement with dinner and networking.