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Greetings!
Welcome to the August issue of Residue News
We're Back . . This past year Foresite has been remiss in providing
the monthly newsletter to those of you on our subscribers' list.
Starting in 2009, we will be sending out a quarterly newsletter with
information relating to industry issues, cleaning problems and
options, and what we are seeing in the realm of testing.
Thank you for your patience as we get the newsletter back into a
regular cycle.
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Upcoming Events |
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Foresite staff will be participating in some upcoming industry
events. See us at SMTAI in Orlando and IPC Midwest in Chicago.
Terry Munson will be presenting, "Why are QFN
and PQFN Packages Failing Due to Leakage and Stray Voltage
Problems?" at the AIMS Harsh Environment Electronics Workshop.
His presentation will be during Session 4 on Monday, August 18,
2008. The presentation will include: advantages of this component
package style, problems associated with the smaller package, and
new ideas to resolve the current issues.
Eric Camden will be presenting, "Challenges
and Solutions of Cleaning No-Clean Flux Residues from Surface
Mount Components," at SMTAI. His presentation will be on
Tuesday, August 19, 2008, at 1:30 p.m. in Coronado D. Eric will
discuss the procedures and effectiveness of cleaning electronic
hardware that has been assembled with a no clean flux and exhibits
a corrosive contamination problem. What are the issues and what is
an effective recovery plan?
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Meet the Problem |
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How Clean Are Plugged Microvias?
Microvia contamination from the fabrication process is not new,
but is leading to a new appearance in immersion tin, silver and
OSP boards. Besides microvias (holes with a 0.013" or smaller
opening) with visible attacks on the metalization surface, we are
seeing open or intermittent open cracked vias. These small
openings are plugged on one side and function as a turned-up cup
in a dishwasher. Wash and rinse water get inside and do not flush
out easily, leaving corrosive residue.
The complete article can be viewed in the July 2008 edition of
Circuits Assembly at www.circuitsassembly.com. Terry Munson is a
monthly contributor as the Process Doctor.
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Partnership with China Laboratory (Microtek) in the Works |
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Foresite is pleased to announce a partnership in China with
Microtek Laboratories. We are in the process of getting our
equipment installed and operational in Microtek's Changzhou
facility. Our vision is to provide our Asia-Pacific customers an
alternative to shipping product to our U.S. facility for testing,
resulting in quicker, lower-cost test results.
Foresite, in conjunction with Microtek, will process samples
and provide a detailed report with photo documentation, sample
data, conclusions, and recommendations.
Paco Solis, Foresite Lead Investigator, will be spending part
of September at Microtek, training the staff on equipment and
Foresite procedures. If you would like additional information
regarding the timeline and testing available, please email us at
foresiteinfo@residues.com. |
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C3 Awarded SMT Magazine's 2008 Vision Award for Test Equipment
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Tracy, Eric, and Paco with Vision Award in Las Vegas
Foresite, Inc.'s C3 Critical Cleanliness Control was awarded
SMT Magazine's 2008 Vision Award for Test Equipment. The
presentation was made at the annual IPC Printed Ciruits Expo /
APEX / Designers Summit in Las Vegas, Nevada, to Aqueous
Technologies, Foresite's worldwide distribution partner.
The C3 is based on a U.S. patent by Terry Munson, President,
Foresite, Inc. Foresite has also received patents for the C3 in
Germany, China and the United Kingdom. Our most recent milestone
has been conforming the C3 to CE mark directives.
Foresite is continually looking at ways to better our product
offerings, including the C3. We have developed a prototype for a
portable C3 that will ease transportation between production
floors or plant locations. Also in development are different test
cells, ranging from a cell that will allow testing of small (QFN)
component areas to one for larger (BGA) components.
Please select the "C3 Information" link below for more detailed
information about the C3. |
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